Feasibility of the beta-albedo-absorption technique application for building non-destructive devices applied in the production of nanomaterials with main dimension parameters (thickness, surface density, and coating)
Keywords:
nanomaterials, measurement, thickness, surface density, measurement error, measurement range, beta radiationAbstract
The explanation is given of the feasibility of using of a relatively unknown beta-albedo-absorption(BAA) technique, which was the research topic of the PHD thesis of the author, for the creation of a modern, unparalleled anywhere in the world, non-destructive testing (NDT) system to be used for the production of nanomaterials with main dimension parameters (thickness, surface density, and coating) in the nanorange, i.e., practically from zero to several hundreds of nanometers. The importance of the problem is determined by the present time intense development both in Russia and all over the world of the production of nanomaterials of different types in the practical absence of the development and production of NDT devices. Analytical expressions are given for the calculation of the main quantitative characteristics of BAA measurement geometry, namely, the radial density distribution and the integral electron backscattering coefficient at the variables of the parameters of the reflecting gas or air medium. The principle of developing the optimum measurement geometry, little dependent on changing parameters of the reflecting medium and minimizing measurement errors for BAA method, is described. The design of the developed detectors is shown. The following recommendations are given on additional experimental studies of the BAA method aiming to provide a possibility of parameter measurement in the nanorange: using the industrial beta sources with a lower value of the maximum beta spectrum energy; increasing the activity of beta sources or measurement time; using special filters for degradation of the beta source emission spectrum; and using beta radiation detectors with the largest possible measurement area
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